Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/334916
Title: Use of Molecular and Cytogenetical Markers for Pyramiding Gene for Leaf Rust Resistance in Wheat
Researcher: Koul, Sunita
Guide(s): Prabhu, K V and Chauhan, S V S
Keywords: Biotechnology and Applied Microbiology
Life Sciences
Microbiology
University: Dr. B. R. Ambedkar University Agra
Completed Date: 2002
Abstract: None newline
Pagination: Various Pages
URI: http://hdl.handle.net/10603/334916
Appears in Departments:Department of Biotechnology

Files in This Item:
File Description SizeFormat 
01 title 1-1.pdfAttached File321.74 kBAdobe PDFView/Open
02 certificate 1-2.pdf720.58 kBAdobe PDFView/Open
03 preliminary pages 1-11.pdf4.65 MBAdobe PDFView/Open
04 chapter 1 1-7.pdf3.18 MBAdobe PDFView/Open
05 chapter 2 8-41.pdf15.13 MBAdobe PDFView/Open
06 chapter 3 42-61.pdf10.4 MBAdobe PDFView/Open
07 chapter 4 62-74.pdf20.15 MBAdobe PDFView/Open
08 chapter 5 75-93.pdf9.24 MBAdobe PDFView/Open
09 chapter 6 94-101.pdf3.45 MBAdobe PDFView/Open
10 bibliography 185 1-15.pdf6.71 MBAdobe PDFView/Open
11 annexures 1-5.pdf2.12 MBAdobe PDFView/Open
80_recommendation.pdf3.45 MBAdobe PDFView/Open
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