Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/333904
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dc.coverage.spatialCost effective novel testing approach for vlsi circuits
dc.date.accessioned2021-07-29T10:16:02Z-
dc.date.available2021-07-29T10:16:02Z-
dc.identifier.urihttp://hdl.handle.net/10603/333904-
dc.description.abstractThe advent of VLSI technology has given rise to sophistication in the devices which can be incorporated into a single chip. Testing of chips using automated methodologies has taken new dimensions in recent years. Testing the accurate functionality of the chip is an essential step in the production process to improve the yield rates. The chip are vulnerable to failures due to higher clock rates, shrinking geometries, longer wires, increasing metal density and with different types of faults reducing the yield and hence, increases the testing cost. The current processes have reached a point, where many conventional pass/fail testing methods are enhanced by defect based fault models and/or grading-based techniques, assessing the quality of the circuit. An essential step for the whole test process is the generation of test patterns. Test patterns are the primary bit patterns used for testing a digital circuitry. Majority of the logical device developed are tested for all functionality before its practical usage. Design-for test (DFT) techniques aim to reduce the cost of Automatic Test Equipment (ATE) by automatically generating tests through Automatic Test Pattern Generation (ATPG).The generated patterns are used to test semiconductor devices getting manufactured, or to assist with determining the cause of failure. The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. The type of Circuit Under Test (CUT) can be combinational, full scan, synchronous sequential or asynchronous sequential circuits. The advantage of introducing optimized test pattern directly reduces the testing time. This results in the reduction of testing costs during online testing. An earlier study has shown increase in test pattern generation count between 40-90%.Increase in test patterns faces several problems. Due to presence of limited transfer of data bandwidth between work station and ATE, test patterns require several tens of hours to upload. During this time newline
dc.format.extentxxv, 189p.
dc.languageEnglish
dc.relationp.179-188
dc.rightsuniversity
dc.titleCost effective novel testing approach for vlsi circuits
dc.title.alternative
dc.creator.researcherPattunnarajam P
dc.subject.keywordEngineering and Technology
dc.subject.keywordEngineering
dc.subject.keywordEngineering Electrical and Electronic
dc.subject.keywordvlsi circuits
dc.subject.keywordtesting approach
dc.description.note
dc.contributor.guideReeba korah and Maria kalavathy G
dc.publisher.placeChennai
dc.publisher.universityAnna University
dc.publisher.institutionFaculty of Information and Communication Engineering
dc.date.registered
dc.date.completed2020
dc.date.awarded2020
dc.format.dimensions21cm
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Faculty of Information and Communication Engineering

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01_title.pdfAttached File48.81 kBAdobe PDFView/Open
02_certificates.pdf513.87 kBAdobe PDFView/Open
03_vivaproceedings.pdf585.5 kBAdobe PDFView/Open
04_bonafidecertificate.pdf313.19 kBAdobe PDFView/Open
05_abstracts.pdf74.87 kBAdobe PDFView/Open
06_acknowledgements.pdf752.95 kBAdobe PDFView/Open
07_contents.pdf20.32 kBAdobe PDFView/Open
08_listoftables.pdf87.27 kBAdobe PDFView/Open
09_listoffigures.pdf79.83 kBAdobe PDFView/Open
10_listofabbreviations.pdf48.26 kBAdobe PDFView/Open
11_chapter1.pdf211.04 kBAdobe PDFView/Open
12_chapter2.pdf735.2 kBAdobe PDFView/Open
13_chapter3.pdf293.18 kBAdobe PDFView/Open
14_chapter4.pdf557.45 kBAdobe PDFView/Open
15_chapter5.pdf990.7 kBAdobe PDFView/Open
16_conclusion.pdf112.64 kBAdobe PDFView/Open
17_references.pdf133.3 kBAdobe PDFView/Open
18_listofpublications.pdf118.89 kBAdobe PDFView/Open
80_recommendation.pdf121.03 kBAdobe PDFView/Open


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