Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/332584
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dc.date.accessioned2021-07-20T04:45:29Z-
dc.date.available2021-07-20T04:45:29Z-
dc.identifier.urihttp://hdl.handle.net/10603/332584-
dc.description.abstractThis research investigates important class of hardware attacks against various embedded devices newlinewhich uses side channel attacks ( passive attacks) and fault injection attacks(active attacks) as a newlinehacking tool. Adversary cleverly chooses these attacks methods in order to break the security of newlineembedded devices. newlineIn case of fault injection attack methods, faults are injected into devices and their faulty behavior newlineare exploited to retrieve secret information. Attacker then observes the faulty behavior in order to newlineextract the secret key. Critical analysis of the properties and the components engaged with these newlinefault injection methods is of high importance to assess the related dangers and furthermore to newlineenhance the process of designing suitable counter-measures. Designing efficient newlinecountermeasures requires first understanding the fault injection attacking process in detail. This newlinerequires thinking and understanding from attackers view point. In contrast to active attacks, newlinepassive attacks are performed by just observing the information consumed during computation of newlineany cryptographic operation such as timing information, power consumption of device etc. Both newlinetypes of attacks are equally important to understand so as to design embedded system resistant newlineagainst all types of attacks. newline newline
dc.format.extent
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleSecuring VLSI Circuits against Side Channel Attacks by using Efficient Detection Technique
dc.title.alternative
dc.creator.researcherShaminder Kaur
dc.subject.keywordEngineering
dc.subject.keywordEngineering and Technology
dc.subject.keywordEngineering Electrical and Electronic
dc.description.note
dc.contributor.guideHarsimran Jit Kaur and Balwinder Singh
dc.publisher.placeChandigarh
dc.publisher.universityChitkara University, Punjab
dc.publisher.institutionFaculty of Electronics
dc.date.registered2016
dc.date.completed2021
dc.date.awarded2021
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Faculty of Electronics

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abstract.pdf97.01 kBAdobe PDFView/Open
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preliminary pages.pdf216.67 kBAdobe PDFView/Open
references.pdf171.52 kBAdobe PDFView/Open
thesis_final_chapter_1.pdf1.07 MBAdobe PDFView/Open
thesis_final_chapter_2.pdf396.97 kBAdobe PDFView/Open
thesis_final_chapter_3.pdf332.69 kBAdobe PDFView/Open
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thesis_final_chapter_5.pdf518.09 kBAdobe PDFView/Open
thesis_final_chapter_6.pdf109.13 kBAdobe PDFView/Open
title.pdf34.17 kBAdobe PDFView/Open


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