Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/318991
Full metadata record
DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2021-04-01T10:01:56Z-
dc.date.available2021-04-01T10:01:56Z-
dc.identifier.urihttp://hdl.handle.net/10603/318991-
dc.description.abstractnewlineAdd
dc.format.extent151
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleMorpho cultural and pathogenic variabilities sources of resistance their DUS characteristics and management of Alternaria blight in rapeseed mustard
dc.title.alternative
dc.creator.researcherRajvanshi, Neeraj Kumar
dc.subject.keywordAgricultural Sciences
dc.subject.keywordAgriculture Multidisciplinary
dc.subject.keywordLife Sciences
dc.description.note
dc.contributor.guideSingh, H.K.
dc.publisher.placeAyodhya
dc.publisher.universityAcharya Narendra Deva University of Agriculture and Technology, Ayodhya
dc.publisher.institutionDepartment of Plant Pathology
dc.date.registered2016
dc.date.completed2020
dc.date.awarded
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Plant Pathology

Files in This Item:
File Description SizeFormat 
01 title.pdfAttached File103.33 kBAdobe PDFView/Open
02 dedication.pdf941.07 kBAdobe PDFView/Open
03 certificate.pdf134.17 kBAdobe PDFView/Open
04 acknowledgement.pdf40.58 kBAdobe PDFView/Open
05 contents.pdf25.24 kBAdobe PDFView/Open
06 chapter1.pdf37.62 kBAdobe PDFView/Open
07 chapter2.pdf194.48 kBAdobe PDFView/Open
08 chapter3.pdf206.2 kBAdobe PDFView/Open
09 chapter4.pdf4.3 MBAdobe PDFView/Open
10 chapter5.pdf183.81 kBAdobe PDFView/Open
11 chapter6.pdf87.62 kBAdobe PDFView/Open
12 chapter7.pdf103.5 kBAdobe PDFView/Open
13 appendix.pdf49.27 kBAdobe PDFView/Open
14 abstract.pdf18.73 kBAdobe PDFView/Open
80_recommendation.pdf103.33 kBAdobe PDFView/Open


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: