Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/316736
Full metadata record
DC FieldValueLanguage
dc.coverage.spatialComputer science
dc.date.accessioned2021-02-26T12:22:35Z-
dc.date.available2021-02-26T12:22:35Z-
dc.identifier.urihttp://hdl.handle.net/10603/316736-
dc.description.abstractfile attached
dc.format.extent219 p.
dc.languageEnglish
dc.relation-
dc.rightsuniversity
dc.titleWeld flaw detection using em segmentation and tetrolet transform
dc.title.alternative-
dc.creator.researcherV Kalaiselvi
dc.subject.keywordComputer Science
dc.subject.keywordComputer Science Information Systems
dc.subject.keywordEM Algorithm
dc.subject.keywordEngineering and Technology
dc.subject.keywordGaussian Filter
dc.subject.keywordImage segmentation
dc.subject.keywordNon destructive testing
dc.subject.keywordSVM
dc.subject.keywordWeld defects
dc.description.notereferences p.196-219
dc.contributor.guideAravindhar, John
dc.publisher.placeChennai
dc.publisher.universityHindustan University
dc.publisher.institutionDepartment of Computer Science and Engineering
dc.date.registered
dc.date.completed2020
dc.date.awarded
dc.format.dimensions-
dc.format.accompanyingmaterialNone
dc.type.degreePh.D.
dc.source.inflibnetINFLIBNET
Appears in Departments:Department of Computer Science and Engineering

Files in This Item:
File Description SizeFormat 
01_title.pdfAttached File331.76 kBAdobe PDFView/Open
02_certificate.pdf331.7 kBAdobe PDFView/Open
03_declaration.pdf332.03 kBAdobe PDFView/Open
04_acknowledgement.pdf214.77 kBAdobe PDFView/Open
05_abstract.pdf215.17 kBAdobe PDFView/Open
06_content.pdf423.18 kBAdobe PDFView/Open
07_chapter 1.pdf604.17 kBAdobe PDFView/Open
08_chapter 2.pdf961.61 kBAdobe PDFView/Open
09_chapter 3.pdf1.14 MBAdobe PDFView/Open
10_chapter 4.pdf4.1 MBAdobe PDFView/Open
11_chapter 5.pdf403.77 kBAdobe PDFView/Open
12_references.pdf612.85 kBAdobe PDFView/Open
13_annexure.pdf914.67 kBAdobe PDFView/Open
80_recommendation.pdf460.15 kBAdobe PDFView/Open


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial 4.0 International (CC BY-NC 4.0).

Altmetric Badge: