Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/3116
Title: | Non-destructive evaluation of ion-implanted semiconductor thin films using Photothermal Deflection Spectroscopy |
Researcher: | Paulraj, M |
Guide(s): | Vijayakumar, K P |
Keywords: | Physics Semiconductor physics Photothermal Deflection Spectroscopy |
Upload Date: | 31-Oct-2011 |
University: | Cochin University of Science and Technology |
Completed Date: | 30/12/2004 |
Pagination: | viii, 256p. |
URI: | http://hdl.handle.net/10603/3116 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 25.61 kB | Adobe PDF | View/Open |
02_certificate.pdf | 33.76 kB | Adobe PDF | View/Open | |
03_declaration.pdf | 23.83 kB | Adobe PDF | View/Open | |
04_acknowledgement.pdf | 80.92 kB | Adobe PDF | View/Open | |
05_dedication.pdf | 10.45 kB | Adobe PDF | View/Open | |
06_contents.pdf | 158.14 kB | Adobe PDF | View/Open | |
07_preface.pdf | 148.44 kB | Adobe PDF | View/Open | |
08_list of publications.pdf | 113.4 kB | Adobe PDF | View/Open | |
09_chapter 1.pdf | 1.6 MB | Adobe PDF | View/Open | |
10_chapter 2.pdf | 1.57 MB | Adobe PDF | View/Open | |
11_chapter 3.pdf | 2.49 MB | Adobe PDF | View/Open | |
12_chapter 4.pdf | 1.32 MB | Adobe PDF | View/Open | |
13_chapter 5.pdf | 1.08 MB | Adobe PDF | View/Open | |
14_chapter 6.pdf | 805.42 kB | Adobe PDF | View/Open | |
15_chapter 7.pdf | 253.8 kB | Adobe PDF | View/Open |
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