1. Shodhganga@INFLIBNET
  2. Koneru Lakshmaiah Education Foundation
  3. Department of Electronics and Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/305260
Title: Analysis of abnormalities recognition methods in retinal images
Researcher: V Ratna Bhargavi
Guide(s): V Rajesh
Keywords: Engineering
Engineering and Technology
Engineering Electrical and Electronic
University: Koneru Lakshmaiah Education Foundation
Completed Date: 2020
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/305260
Appears in Departments:Department of Electronics and Communication Engineering

Files in This Item:
File Description SizeFormat 
10 chapter 2.pdfAttached File1.36 MBAdobe PDFView/Open
11 chapter 3.pdf521.13 kBAdobe PDFView/Open
12 chapter 4.pdf423.45 kBAdobe PDFView/Open
13 chapter 5.pdf398.53 kBAdobe PDFView/Open
14 chapter 6.pdf464.43 kBAdobe PDFView/Open
15 conclusion.pdf13.82 kBAdobe PDFView/Open
16 references.pdf338.8 kBAdobe PDFView/Open
1 title.pdf56.61 kBAdobe PDFView/Open
2 certificate.pdf131.17 kBAdobe PDFView/Open
3 abstract.pdf39.28 kBAdobe PDFView/Open
4 declaration.pdf132.25 kBAdobe PDFView/Open
5 acknowledgements.pdf303.46 kBAdobe PDFView/Open
6 contents.pdf333.68 kBAdobe PDFView/Open
7 list of tables.pdf34.72 kBAdobe PDFView/Open
80_recommendation.pdf3.5 MBAdobe PDFView/Open
8 list of figures.pdf160.26 kBAdobe PDFView/Open
9 chapter 1.pdf367.41 kBAdobe PDFView/Open
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