1. Shodhganga@INFLIBNET
  2. Homi Bhabha National Institute
  3. Department of Physical Sciences
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/293056
Title: thermal stability structure and interface study of x ray multilayers for euv and soft x ray applications
Researcher: nageswararao pothana
Guide(s): Tapas Ganguli
Keywords: Physical Sciences
Physics
University: Homi Bhabha National Institute
Completed Date: 2018
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/293056
Appears in Departments:Department of Physical Sciences

Files in This Item:
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01_title.pdfAttached File203.26 kBAdobe PDFView/Open
02_certificate.pdf487.63 kBAdobe PDFView/Open
03_prelim_pages.pdf343.24 kBAdobe PDFView/Open
04_contents.pdf464.19 kBAdobe PDFView/Open
05_tabfiglist.pdf903.09 kBAdobe PDFView/Open
06_chapter_1.pdf752.22 kBAdobe PDFView/Open
07_chapter_2.pdf1.21 MBAdobe PDFView/Open
08_chapter_3.pdf1.54 MBAdobe PDFView/Open
09_chapter_4.pdf2.36 MBAdobe PDFView/Open
10_chapter_5.pdf1.51 MBAdobe PDFView/Open
11_chapter_6.pdf2.05 MBAdobe PDFView/Open
12_chapter_7.pdf313.44 kBAdobe PDFView/Open
13_misc.pdf2.03 MBAdobe PDFView/Open
80_recommendation.pdf203.26 kBAdobe PDFView/Open
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