Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/291493
Title: | Methodologies for testing and Locating Faults in Integrated Circuits |
Researcher: | Khade R. H. |
Guide(s): | Chaudhari, D. S. |
Keywords: | Engineering Engineering and Technology Engineering Electrical and Electronic |
University: | North Maharashtra University |
Completed Date: | |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/291493 |
Appears in Departments: | Department of Electronics Engineering and Technology |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
80_recommendation.pdf | Attached File | 204.48 kB | Adobe PDF | View/Open |
a1-cover page.pdf | 6.12 kB | Adobe PDF | View/Open | |
abstract and content and others.pdf | 2.28 MB | Adobe PDF | View/Open | |
appendix_a.pdf | 219.95 kB | Adobe PDF | View/Open | |
appendix_b.pdf | 164.78 kB | Adobe PDF | View/Open | |
appendix_c.pdf | 219.6 kB | Adobe PDF | View/Open | |
appendix_d.pdf | 134.8 kB | Adobe PDF | View/Open | |
chapter1.pdf | 170.9 kB | Adobe PDF | View/Open | |
chapter2.pdf | 504.76 kB | Adobe PDF | View/Open | |
chapter3.pdf | 1.7 MB | Adobe PDF | View/Open | |
chapter4.pdf | 377.62 kB | Adobe PDF | View/Open | |
chapter5.pdf | 205.52 kB | Adobe PDF | View/Open |
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