1. Shodhganga@INFLIBNET
  2. Sri Venkateswara University
  3. Department of Electronics & Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/284476
Title: A Systematic Crop yield Using NOAA Landsat 8 Satellites Data Through Dual Three Complex Wavelet Based Denoising and Enhancement Techniques
Researcher: Satheesh Kumar Kanagala
Guide(s): Sreenivasulu G
University: Sri Venkateswara University
Completed Date: 2018
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/284476
Appears in Departments:Department of Electronics & Communication Engineering

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01_title.pdfAttached File379.45 kBAdobe PDFView/Open
02_certificate.pdf228.94 kBAdobe PDFView/Open
03_declaration.pdf76.16 kBAdobe PDFView/Open
04_acknowledgements.pdf21.67 kBAdobe PDFView/Open
05_contents.pdf59.07 kBAdobe PDFView/Open
06_list of abbreviations.pdf25.19 kBAdobe PDFView/Open
07_list of tables.pdf81.85 kBAdobe PDFView/Open
08_list of figures.pdf15.21 kBAdobe PDFView/Open
09_list of symbols.pdf295.34 kBAdobe PDFView/Open
10_chapter_01.pdf531.14 kBAdobe PDFView/Open
11_chapter_02.pdf267.74 kBAdobe PDFView/Open
12_chapter_03.pdf630.66 kBAdobe PDFView/Open
13_chapter_04.pdf722.14 kBAdobe PDFView/Open
14_chapter_05.pdf774.2 kBAdobe PDFView/Open
15_chapter_06.pdf3.94 MBAdobe PDFView/Open
16_chapter_07.pdf102.31 kBAdobe PDFView/Open
17_references.pdf209.59 kBAdobe PDFView/Open
18_appendix.pdf239.26 kBAdobe PDFView/Open
19_separators.pdf254.77 kBAdobe PDFView/Open
20_plagiarism report.pdf367.19 kBAdobe PDFView/Open
21_abstract.pdf157.94 kBAdobe PDFView/Open
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