Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/280988
Title: Study of ion implantation induced defect impurity interactions in silicon
Researcher: Mohapatra, Satyabrata
Guide(s): Mahapatra, DP
Keywords: Defect-Impurity
Implantation
Silicon
University: Utkal University
Completed Date: 2006
Abstract: Abstract not available
Pagination: xii, 115p.
URI: http://hdl.handle.net/10603/280988
Appears in Departments:Department of Physics

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01_title page.pdfAttached File88.89 kBAdobe PDFView/Open
02_certificate.pdf88.46 kBAdobe PDFView/Open
03_declaration.pdf90.62 kBAdobe PDFView/Open
04_dedication.pdf11.7 kBAdobe PDFView/Open
05_acknowledgement.pdf211.75 kBAdobe PDFView/Open
06_list of publication.pdf120.25 kBAdobe PDFView/Open
07_contents.pdf82.72 kBAdobe PDFView/Open
08_chapter 1.pdf946.37 kBAdobe PDFView/Open
09_chapter 2.pdf740.18 kBAdobe PDFView/Open
10_chapter 3.pdf965.18 kBAdobe PDFView/Open
11_chapter 4.pdf970.43 kBAdobe PDFView/Open
12_chapter 5.pdf1.59 MBAdobe PDFView/Open
13_chapter 6.pdf1.09 MBAdobe PDFView/Open
14_chapter 7.pdf1.23 MBAdobe PDFView/Open
15_chapter 8.pdf238.79 kBAdobe PDFView/Open
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