Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/275426
Title: A study on reliability of III V HEMT materials and devices
Researcher: Chaubey,Rupesh Kumar
Guide(s): Srivastava,P.C.
Keywords: Physical Sciences,Physics,HEMT materials and devices
University: Banaras Hindu University
Completed Date: 2015
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/275426
Appears in Departments:Department of Physics

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01_title.pdfAttached File76.3 kBAdobe PDFView/Open
02_abstract.pdf159.52 kBAdobe PDFView/Open
03_certificate.pdf494.33 kBAdobe PDFView/Open
04_acknowledgement.pdf147.38 kBAdobe PDFView/Open
05_content.pdf150.09 kBAdobe PDFView/Open
06_preface.pdf150.56 kBAdobe PDFView/Open
07_chapter1.pdf1.45 MBAdobe PDFView/Open
08_chapter2.pdf1.97 MBAdobe PDFView/Open
09_chapter3.pdf168.03 kBAdobe PDFView/Open
10_chapter4.pdf6.42 MBAdobe PDFView/Open
11_chapter5.pdf4.58 MBAdobe PDFView/Open
12_chapter6.pdf102.4 kBAdobe PDFView/Open
13_conclusion.pdf102.4 kBAdobe PDFView/Open
14_references.pdf83.06 kBAdobe PDFView/Open
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