Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/274460
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.coverage.spatial | ||
dc.date.accessioned | 2020-02-07T05:03:28Z | - |
dc.date.available | 2020-02-07T05:03:28Z | - |
dc.identifier.uri | http://hdl.handle.net/10603/274460 | - |
dc.description.abstract | newline | |
dc.format.extent | ||
dc.language | English | |
dc.relation | ||
dc.rights | university | |
dc.title | Radiation defects in materials and their charazation using ESR UV visble spectrometry and TL | |
dc.title.alternative | ||
dc.creator.researcher | Santosh Kumar Suman | |
dc.description.note | ||
dc.contributor.guide | R M Kadam | |
dc.publisher.place | Mumbai | |
dc.publisher.university | Homi Bhabha National Institute | |
dc.publisher.institution | Department of Chemical Sciences | |
dc.date.registered | 1-9-2011 | |
dc.date.completed | 2018 | |
dc.date.awarded | ||
dc.format.dimensions | ||
dc.format.accompanyingmaterial | DVD | |
dc.source.university | University | |
dc.type.degree | Ph.D. | |
Appears in Departments: | Department of Chemical Sciences |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
certificate.pdf | Attached File | 185.29 kB | Adobe PDF | View/Open |
chap1.pdf | 292.56 kB | Adobe PDF | View/Open | |
chap2.pdf | 645.98 kB | Adobe PDF | View/Open | |
chap3.pdf | 1.56 MB | Adobe PDF | View/Open | |
chap4.pdf | 154.15 kB | Adobe PDF | View/Open | |
chap5.pdf | 165.32 kB | Adobe PDF | View/Open | |
chap6.pdf | 185.29 kB | Adobe PDF | View/Open | |
content.pdf | 64.12 kB | Adobe PDF | View/Open | |
misc.pdf | 119.33 kB | Adobe PDF | View/Open | |
prelim.pdf | 384.75 kB | Adobe PDF | View/Open | |
synopsis.pdf | 112.75 kB | Adobe PDF | View/Open | |
tabfiglist.pdf | 68.54 kB | Adobe PDF | View/Open | |
title.pdf | 37.03 kB | Adobe PDF | View/Open |
Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).
Altmetric Badge: