1. Shodhganga@INFLIBNET
  2. Homi Bhabha National Institute
  3. Department of Physical Sciences
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/273760
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DC FieldValueLanguage
dc.coverage.spatial
dc.date.accessioned2020-02-04T11:17:11Z-
dc.date.available2020-02-04T11:17:11Z-
dc.identifier.urihttp://hdl.handle.net/10603/273760-
dc.description.abstractnewline
dc.format.extent
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleMultilayer Film Deposition Characterization by Reflectometry Techniques and Their Structure Property Correlation
dc.title.alternative
dc.creator.researcherMITALI SWAIN
dc.description.note
dc.contributor.guideSaibal Basu
dc.publisher.placeMumbai
dc.publisher.universityHomi Bhabha National Institute
dc.publisher.institutionDepartment of Physical Sciences
dc.date.registered1-9-2008
dc.date.completed2015
dc.date.awarded
dc.format.dimensions
dc.format.accompanyingmaterialDVD
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Physical Sciences

Files in This Item:
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01_title.pdfAttached File321.89 kBAdobe PDFView/Open
02_certificate.pdf569.16 kBAdobe PDFView/Open
03_prelim_pages.pdf577.65 kBAdobe PDFView/Open
04_contets.pdf208.59 kBAdobe PDFView/Open
05_abstract.pdf285.66 kBAdobe PDFView/Open
06_tabfiglist.pdf516.8 kBAdobe PDFView/Open
07_chapter_1.pdf930.14 kBAdobe PDFView/Open
08_chapter_2.pdf1.37 MBAdobe PDFView/Open
09_chapter_3.pdf1.57 MBAdobe PDFView/Open
10_chapter_4.pdf3.08 MBAdobe PDFView/Open
11_chapter_5.pdf1.2 MBAdobe PDFView/Open
12_chapter_6.pdf311.5 kBAdobe PDFView/Open
13_misc.pdf477.36 kBAdobe PDFView/Open
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