1. Shodhganga@INFLIBNET
  2. Homi Bhabha National Institute
  3. Department of Physical Sciences
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/273760
Title: Multilayer Film Deposition Characterization by Reflectometry Techniques and Their Structure Property Correlation
Researcher: MITALI SWAIN
Guide(s): Saibal Basu
University: Homi Bhabha National Institute
Completed Date: 2015
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/273760
Appears in Departments:Department of Physical Sciences

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01_title.pdfAttached File321.89 kBAdobe PDFView/Open
02_certificate.pdf569.16 kBAdobe PDFView/Open
03_prelim_pages.pdf577.65 kBAdobe PDFView/Open
04_contets.pdf208.59 kBAdobe PDFView/Open
05_abstract.pdf285.66 kBAdobe PDFView/Open
06_tabfiglist.pdf516.8 kBAdobe PDFView/Open
07_chapter_1.pdf930.14 kBAdobe PDFView/Open
08_chapter_2.pdf1.37 MBAdobe PDFView/Open
09_chapter_3.pdf1.57 MBAdobe PDFView/Open
10_chapter_4.pdf3.08 MBAdobe PDFView/Open
11_chapter_5.pdf1.2 MBAdobe PDFView/Open
12_chapter_6.pdf311.5 kBAdobe PDFView/Open
13_misc.pdf477.36 kBAdobe PDFView/Open
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