Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/266607
Title: Study of Soft Magnetic Bulk and Multilayer Systems
Researcher: Vyash , Anupam
Guide(s): Brajpuriya , Ranjeet K.
Keywords: Physical Sciences,Physics,Physics Applied
University: Amity University Haryana
Completed Date: 2018
Abstract: The study about Nanoscience and Nanotechnology have evolved as one of the most important research fields resulting from an on-going effort to miniaturize at the nanoscale processes that currently use microsystems and enjoying their essence. In actual, nanotechnology has the tremendous potential to revolutionize the world of materials. Nanocrystalline materials have attracted much of the interest because of novel properties, which are remarkably different from bulk materials. In these materials, a large fraction of atoms is located on grain boundaries due to the extremely small size of the grains. The large surface to volume ratio and the structural distortions associated with grain boundaries and interfaces leads to change in physical properties of material like increased strength/hardness, higher specific heat, reduced density, lower thermal conductivity, higher thermal expansion coefficient, lower electrical conductivity and change in magnetic behaviour etc. newline
Pagination: xxxvi , 135
URI: http://hdl.handle.net/10603/266607
Appears in Departments:Department of Physics

Files in This Item:
File Description SizeFormat 
3. reference.pdfAttached File1.28 MBAdobe PDFView/Open
certificate.pdf84.95 kBAdobe PDFView/Open
chapter 1.pdf1.07 MBAdobe PDFView/Open
chapter 2.pdf356.31 kBAdobe PDFView/Open
chapter 3.pdf651.6 kBAdobe PDFView/Open
chapter 4.pdf1.64 MBAdobe PDFView/Open
chapter 5.pdf920.03 kBAdobe PDFView/Open
chapter 6.pdf668 kBAdobe PDFView/Open
chapter 7.pdf1.49 MBAdobe PDFView/Open
premilinary.pdf221.23 kBAdobe PDFView/Open
title.pdf14.07 kBAdobe PDFView/Open
Show full item record


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: