Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/263301
Title: Genetic analysis of biometric traits yield grain quality and bacterial leaf blight resistance in rice oryza sativa l
Researcher: Santha S.
Guide(s): R. VAITHILINGAM
Keywords: Life Sciences,Molecular Biology and Genetics,Genetics and Heredity
University: Tamil Nadu Agricultural University
Completed Date: 2012
Abstract: newline
Pagination: 
URI: http://hdl.handle.net/10603/263301
Appears in Departments:Genetics and Plant Breeding

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