Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/263301
Title: | Genetic analysis of biometric traits yield grain quality and bacterial leaf blight resistance in rice oryza sativa l |
Researcher: | Santha S. |
Guide(s): | R. VAITHILINGAM |
Keywords: | Life Sciences,Molecular Biology and Genetics,Genetics and Heredity |
University: | Tamil Nadu Agricultural University |
Completed Date: | 2012 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/263301 |
Appears in Departments: | Genetics and Plant Breeding |
Files in This Item:
File | Description | Size | Format | |
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d-731a.pdf | Attached File | 45.04 kB | Adobe PDF | View/Open |
d-731b.pdf | 640.74 kB | Adobe PDF | View/Open | |
d-731c.pdf | 151.95 kB | Adobe PDF | View/Open | |
d-731d.pdf | 47.37 kB | Adobe PDF | View/Open | |
d-731e.pdf | 736.18 kB | Adobe PDF | View/Open | |
d-731f.pdf | 2.53 MB | Adobe PDF | View/Open |
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