Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/250074
Title: An Analysis of Test Data Compression Techniques for various Embedded Cores
Researcher: Chakrapani K
Guide(s): Muthaiah R
Keywords: Data Test Techniques
Engineering and Technology,Computer Science,Computer Science Information Systems
Test Data Compression
VLSI
University: SASTRA University
Completed Date: 16/04/2018
Abstract: Abstract Included newline
Pagination: x; 105
URI: http://hdl.handle.net/10603/250074
Appears in Departments:School of Computing

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01_title.pdfAttached File80.92 kBAdobe PDFView/Open
02_acknowledgement.pdf83.33 kBAdobe PDFView/Open
03_table of contents.pdf164.52 kBAdobe PDFView/Open
04_list_ of_ tables.pdf140.36 kBAdobe PDFView/Open
05_list_ of_ figures.pdf136.15 kBAdobe PDFView/Open
06_abstract.pdf120.6 kBAdobe PDFView/Open
07_chapter_ 01.pdf223.99 kBAdobe PDFView/Open
08_chapter_02.pdf445.49 kBAdobe PDFView/Open
09_chapter_03.pdf562.23 kBAdobe PDFView/Open
10_ chapter_04.pdf601.74 kBAdobe PDFView/Open
11_chapter_05.pdf890.4 kBAdobe PDFView/Open
12_chapter_06.pdf216.8 kBAdobe PDFView/Open
13_reference.pdf319.88 kBAdobe PDFView/Open
14_ list _of_ abbreviations.pdf169.5 kBAdobe PDFView/Open
15_ list_ of_ publications.pdf126.94 kBAdobe PDFView/Open
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