Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/24720
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dc.coverage.spatialElectrical and Electronics Engineeringen_US
dc.date.accessioned2014-09-08T04:34:33Z-
dc.date.available2014-09-08T04:34:33Z-
dc.date.issued2014-09-08-
dc.identifier.urihttp://hdl.handle.net/10603/24720-
dc.description.abstractThis research work deals with the diagnosis of soft faults in analog electronic circuits Soft faults that occur even in a single component of a large circuit may cumulatively lead to overall performance deterioration and improper circuit behavior The major challenge in the research work undertaken is to identify the parameter variation of the components beyond their tolerances In this open area of research, there are still unsolved and unraveled problems During the last decades many methods were made to detect different types of faults in different types of circuits and with a different access to their interior Significant works carried out in the diagnosis of faults occurring in analog circuits have been reported in the literatures Serious challenges were encountered when detecting slowly growing fault conditions in circuits owing to non linear behavior of components lumped parameter assumptions influence of ambient temperatures in semiconductor devices etc Few such problems have been identified and new techniques have been proposed to carry out component level fault diagnosis of analog circuits by proposing new techniques based on the frequency response of the circuiten_US
dc.format.extentxviii,133p.en_US
dc.languageEnglishen_US
dc.relation-en_US
dc.rightsuniversityen_US
dc.titleCertain new approaches to fault diagnosis of analog electronic circuits using frequency response methodsen_US
dc.title.alternative-en_US
dc.creator.researcherKavithamani, Aen_US
dc.subject.keywordAnalog electronic circuitsen_US
dc.subject.keywordElectrical engineeringen_US
dc.subject.keywordElectronic circuitsen_US
dc.subject.keywordFault diagnosisen_US
dc.subject.keywordFrequency response methoden_US
dc.description.note-en_US
dc.contributor.guideManikandan, Ven_US
dc.publisher.placeChennaien_US
dc.publisher.universityAnna Universityen_US
dc.publisher.institutionFaculty of Electrical and Electronics Engineeringen_US
dc.date.registeredn.d.en_US
dc.date.completed01/05/2012en_US
dc.date.awarded30/05/2012en_US
dc.format.dimensions23cm.en_US
dc.format.accompanyingmaterialNoneen_US
dc.source.universityUniversityen_US
dc.type.degreePh.D.en_US
Appears in Departments:Faculty of Electrical and Electronics Engineering

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01_title.pdfAttached File128.02 kBAdobe PDFView/Open
02_certificates.pdf3.2 MBAdobe PDFView/Open
03_abstract.pdf6.46 kBAdobe PDFView/Open
04_acknowledgement.pdf6.57 kBAdobe PDFView/Open
05_contents.pdf23.58 kBAdobe PDFView/Open
06_chapter1.pdf72.07 kBAdobe PDFView/Open
07_chapter2.pdf1 MBAdobe PDFView/Open
08_chapter3.pdf859.14 kBAdobe PDFView/Open
09_chapter4.pdf663.84 kBAdobe PDFView/Open
10_chpater5.pdf48.29 kBAdobe PDFView/Open
11_chapter6.pdf120.22 kBAdobe PDFView/Open
12_chapter7.pdf6.71 kBAdobe PDFView/Open
13_references.pdf46.5 kBAdobe PDFView/Open
14_publications.pdf7.2 kBAdobe PDFView/Open
15_vitae.pdf5.22 kBAdobe PDFView/Open


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