Certain new approaches to fault diagnosis of analog electronic circuits using frequency response methods

Abstract

This research work deals with the diagnosis of soft faults in analog electronic circuits Soft faults that occur even in a single component of a large circuit may cumulatively lead to overall performance deterioration and improper circuit behavior The major challenge in the research work undertaken is to identify the parameter variation of the components beyond their tolerances In this open area of research, there are still unsolved and unraveled problems During the last decades many methods were made to detect different types of faults in different types of circuits and with a different access to their interior Significant works carried out in the diagnosis of faults occurring in analog circuits have been reported in the literatures Serious challenges were encountered when detecting slowly growing fault conditions in circuits owing to non linear behavior of components lumped parameter assumptions influence of ambient temperatures in semiconductor devices etc Few such problems have been identified and new techniques have been proposed to carry out component level fault diagnosis of analog circuits by proposing new techniques based on the frequency response of the circuit