Random variability study in advanced CMOS devices

Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/245396

Full metadata record

DC Field	Value	Language
dc.coverage.spatial
dc.date.accessioned	2019-06-03T07:11:06Z	-
dc.date.available	2019-06-03T07:11:06Z	-
dc.identifier.uri	http://hdl.handle.net/10603/245396	-
dc.description.abstract	Abstract available
dc.format.extent	viii, 143p
dc.language	English
dc.relation	134 - 138
dc.rights	university
dc.title	Random variability study in advanced CMOS devices
dc.title.alternative
dc.creator.researcher	Nawaz, Masum
dc.subject.keyword	Electronic
dc.subject.keyword	Engineering and Technology,Engineering,Engineering Electrical and Electronic
dc.subject.keyword	Mosfet
dc.subject.keyword	Scaling
dc.subject.keyword	Science
dc.description.note
dc.contributor.guide	Mallik, Abhijit
dc.publisher.place	Kolkata
dc.publisher.university	University of Calcutta
dc.publisher.institution	Department of Electronic Science
dc.date.registered
dc.date.completed	2017
dc.date.awarded
dc.format.dimensions
dc.format.accompanyingmaterial	DVD
dc.source.university	University
dc.type.degree	Ph.D.
Appears in Departments:	Department of Electronic Science

Files in This Item:

File	Description	Size	Format
01_title page.pdf	Attached File	177.24 kB	Adobe PDF	View/Open
02_abstract.pdf		547.46 kB	Adobe PDF	View/Open
03_acknowledgemnt.pdf		100.95 kB	Adobe PDF	View/Open
04_list of publication.pdf		234.52 kB	Adobe PDF	View/Open
05_content.pdf		179.56 kB	Adobe PDF	View/Open
06_chapter 1.pdf		375.47 kB	Adobe PDF	View/Open
07_chapter 2.pdf		1.35 MB	Adobe PDF	View/Open
08_chapter 3.pdf		410.06 kB	Adobe PDF	View/Open
09_chapter 4.pdf		719.39 kB	Adobe PDF	View/Open
10_chapter 5.pdf		553.77 kB	Adobe PDF	View/Open
11_chapter 6.pdf		421.04 kB	Adobe PDF	View/Open
12_chapter 7.pdf		399.91 kB	Adobe PDF	View/Open
13_chapter 8.pdf		350.48 kB	Adobe PDF	View/Open