1. Shodhganga@INFLIBNET
  2. University of Calcutta
  3. Department of Electronic Science
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/245396
Title: Random variability study in advanced CMOS devices
Researcher: Nawaz, Masum
Guide(s): Mallik, Abhijit
Keywords: Electronic
Engineering and Technology,Engineering,Engineering Electrical and Electronic
Mosfet
Scaling
Science
University: University of Calcutta
Completed Date: 2017
Abstract: Abstract available
Pagination: viii, 143p
URI: http://hdl.handle.net/10603/245396
Appears in Departments:Department of Electronic Science

Files in This Item:
File Description SizeFormat 
01_title page.pdfAttached File177.24 kBAdobe PDFView/Open
02_abstract.pdf547.46 kBAdobe PDFView/Open
03_acknowledgemnt.pdf100.95 kBAdobe PDFView/Open
04_list of publication.pdf234.52 kBAdobe PDFView/Open
05_content.pdf179.56 kBAdobe PDFView/Open
06_chapter 1.pdf375.47 kBAdobe PDFView/Open
07_chapter 2.pdf1.35 MBAdobe PDFView/Open
08_chapter 3.pdf410.06 kBAdobe PDFView/Open
09_chapter 4.pdf719.39 kBAdobe PDFView/Open
10_chapter 5.pdf553.77 kBAdobe PDFView/Open
11_chapter 6.pdf421.04 kBAdobe PDFView/Open
12_chapter 7.pdf399.91 kBAdobe PDFView/Open
13_chapter 8.pdf350.48 kBAdobe PDFView/Open
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