Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/234535
Title: | An analytical study of high power schottky barrier diode on 4H silicon carbide SiC wafers |
Researcher: | Talwar, Rajneesh |
Guide(s): | Chatterjee, A. K. |
Keywords: | 4H-SiC Engineering and Technology,Engineering,Engineering Electrical and Electronic Linear Graded Doping Power Device Schottky Barrier Diode Silicon Carbide |
University: | Thapar Institute of Engineering and Technology |
Completed Date: | 2010 |
Pagination: | xviii, 105p. |
URI: | http://hdl.handle.net/10603/234535 |
Appears in Departments: | Department of Electronics and Communication Engineering |
Files in This Item:
File | Description | Size | Format | |
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file10(references).pdf | Attached File | 203.37 kB | Adobe PDF | View/Open |
file1(title).pdf | 63.34 kB | Adobe PDF | View/Open | |
file2(certificate).pdf | 935.31 kB | Adobe PDF | View/Open | |
file3(preliminary pages).pdf | 748.56 kB | Adobe PDF | View/Open | |
file4(chapter 1).pdf | 457.9 kB | Adobe PDF | View/Open | |
file5(chapter 2).pdf | 362.44 kB | Adobe PDF | View/Open | |
file6(chapter 3).pdf | 410.03 kB | Adobe PDF | View/Open | |
file7(chapter 4).pdf | 280.19 kB | Adobe PDF | View/Open | |
file8(chapter 5).pdf | 347.13 kB | Adobe PDF | View/Open | |
file9(chapter 6).pdf | 224.96 kB | Adobe PDF | View/Open |
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