Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/232765
Title: Investigations on performance analysis of test power reduction and test data compression techniques for digital integrated circuits
Researcher: B, Manjurathi
Guide(s): Harikumar, R
Keywords: Bandwidth
DataCompression
DynamicPower
Fabrication
SwarmOptimization
University: Anna University
Completed Date: 2017
Abstract: Abstract available
Pagination: xxi, 159p.
URI: http://hdl.handle.net/10603/232765
Appears in Departments:Faculty of Information and Communication Engineering

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01_title page.pdfAttached File24.87 kBAdobe PDFView/Open
02_certificate.pdf628.22 kBAdobe PDFView/Open
03_abstract.pdf164.5 kBAdobe PDFView/Open
04_acknowledgement.pdf9.9 kBAdobe PDFView/Open
05_table of content.pdf340.63 kBAdobe PDFView/Open
06_list of table.pdf167.78 kBAdobe PDFView/Open
07_list of figures.pdf8.46 kBAdobe PDFView/Open
08_list of abbreviation.pdf9.64 kBAdobe PDFView/Open
09_chapter 1.pdf547.63 kBAdobe PDFView/Open
10_chapter 2.pdf418.51 kBAdobe PDFView/Open
11_chapter 3.pdf592.43 kBAdobe PDFView/Open
12_chapter 4.pdf573.06 kBAdobe PDFView/Open
13_chapter 5.pdf675.53 kBAdobe PDFView/Open
14_chapter 6.pdf491.27 kBAdobe PDFView/Open
15_chapter 7.pdf399.88 kBAdobe PDFView/Open
16_chapter 8.pdf441.16 kBAdobe PDFView/Open
17_chapter 9.pdf664.59 kBAdobe PDFView/Open
18_references.pdf256.29 kBAdobe PDFView/Open
19_list of publication.pdf167.72 kBAdobe PDFView/Open
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