Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/232728
Full metadata record
DC FieldValueLanguage
dc.coverage.spatialScience and Humanities
dc.date.accessioned2019-03-19T04:50:43Z-
dc.date.available2019-03-19T04:50:43Z-
dc.identifier.urihttp://hdl.handle.net/10603/232728-
dc.description.abstractAbstract available
dc.format.extentxvi, 110p.
dc.languageOthers
dc.relation97-108
dc.rightsuniversity
dc.titleA spiral lifecycle model based Bayesian classification technique for efficient software fault prediction and classification
dc.title.alternative
dc.creator.researcherD, Rajaganapathy C
dc.subject.keywordBayesian
dc.subject.keywordDelimitation
dc.subject.keywordEntropy
dc.subject.keywordMultivariateRegression
dc.subject.keywordRobust
dc.description.noteData not available
dc.contributor.guideSubramani, A; Balamurugan, P
dc.publisher.placeChennai
dc.publisher.universityAnna University
dc.publisher.institutionFaculty of Science and Humanities
dc.date.registeredn.d.
dc.date.completed2018
dc.date.awardedn.d.
dc.format.dimensions30cm.
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Faculty of Science and Humanities

Files in This Item:
File Description SizeFormat 
01_title page.pdfAttached File29.83 kBAdobe PDFView/Open
02_certificate.pdf674.9 kBAdobe PDFView/Open
03_abstract.pdf9.83 kBAdobe PDFView/Open
04_acknowledgement.pdf8.47 kBAdobe PDFView/Open
05_table of content.pdf13.41 kBAdobe PDFView/Open
06_list of table.pdf3.54 kBAdobe PDFView/Open
07_list of figures.pdf3.54 kBAdobe PDFView/Open
08_list of abbreviation.pdf7.3 kBAdobe PDFView/Open
09_chapter 1.pdf215.86 kBAdobe PDFView/Open
10_chapter 2.pdf885.05 kBAdobe PDFView/Open
11_chapter 3.pdf943.39 kBAdobe PDFView/Open
12_chapter 4.pdf519.92 kBAdobe PDFView/Open
13_chapter 5.pdf46.28 kBAdobe PDFView/Open
14_references.pdf270.42 kBAdobe PDFView/Open
15_list of publication.pdf30.99 kBAdobe PDFView/Open


Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).

Altmetric Badge: