Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/232615
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DC FieldValueLanguage
dc.coverage.spatialInformation and Communication Engineering
dc.date.accessioned2019-03-18T10:22:02Z-
dc.date.available2019-03-18T10:22:02Z-
dc.identifier.urihttp://hdl.handle.net/10603/232615-
dc.description.abstractAbstract available
dc.format.extentxix, 185p.
dc.languageOthers
dc.relation167-184
dc.rightsuniversity
dc.titleEnhanced approach for reducing redundant test cases
dc.title.alternative
dc.creator.researcherP, Indumathi C
dc.subject.keywordMemoryUsage
dc.subject.keywordRegression
dc.subject.keywordSiemensSuite
dc.subject.keywordTestSuite
dc.subject.keywordTSRFrameworks
dc.description.noteData not available
dc.contributor.guideSelvamani, K
dc.publisher.placeChennai
dc.publisher.universityAnna University
dc.publisher.institutionFaculty of Information and Communication Engineering
dc.date.registeredn.d.
dc.date.completed2017
dc.date.awardedn.d.
dc.format.dimensions30cm.
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Faculty of Information and Communication Engineering

Files in This Item:
File Description SizeFormat 
01_title page.pdfAttached File22.95 kBAdobe PDFView/Open
02_certificate.pdf709.49 kBAdobe PDFView/Open
03_abstract.pdf8.03 kBAdobe PDFView/Open
04_acknowledgement.pdf5.21 kBAdobe PDFView/Open
05_table of content.pdf20.01 kBAdobe PDFView/Open
06_list of table.pdf11.87 kBAdobe PDFView/Open
07_list of figures.pdf7.6 kBAdobe PDFView/Open
08_list of abbreviation.pdf6.8 kBAdobe PDFView/Open
09_chapter 1.pdf324.86 kBAdobe PDFView/Open
10_chapter 2.pdf557.41 kBAdobe PDFView/Open
11_chapter 3.pdf564.59 kBAdobe PDFView/Open
12_chapter 4.pdf364.51 kBAdobe PDFView/Open
13_chapter 5.pdf564.05 kBAdobe PDFView/Open
14_chapter 6.pdf303.09 kBAdobe PDFView/Open
15_appendix 1.pdf381.03 kBAdobe PDFView/Open
16_appendix 2.pdf436.3 kBAdobe PDFView/Open
17_references.pdf313.41 kBAdobe PDFView/Open
18_list of publication.pdf182.46 kBAdobe PDFView/Open


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