Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/226542
Title: | Design of built in self test controller using march algorithm for fault diagnosis in embedded memories |
Researcher: | Ahmed, Mohammed Altaf |
Guide(s): | Elizabeth, Rani D and Sattar, Syed Abdul |
Keywords: | Engineering and Technology,Engineering,Engineering Electrical and Electronic |
University: | GITAM University |
Completed Date: | 2018 |
Abstract: | None |
Pagination: | 133 p. |
URI: | http://hdl.handle.net/10603/226542 |
Appears in Departments: | Department of Electronics and Communication Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 494.62 kB | Adobe PDF | View/Open |
02_certificates.pdf | 371.18 kB | Adobe PDF | View/Open | |
03_acknowledgements.pdf | 361.7 kB | Adobe PDF | View/Open | |
04_contents.pdf | 381.49 kB | Adobe PDF | View/Open | |
05_preface.pdf | 352.46 kB | Adobe PDF | View/Open | |
06_list of tables figures.pdf | 371.31 kB | Adobe PDF | View/Open | |
07_chapter 1.pdf | 572.26 kB | Adobe PDF | View/Open | |
08_chapter 2.pdf | 825.35 kB | Adobe PDF | View/Open | |
09_chapter 3.pdf | 826.09 kB | Adobe PDF | View/Open | |
10_chapter 4.pdf | 1.67 MB | Adobe PDF | View/Open | |
11_chapter 5.pdf | 1.26 MB | Adobe PDF | View/Open | |
12_chapter 6.pdf | 2.39 MB | Adobe PDF | View/Open | |
13_chapter 7.pdf | 332.6 kB | Adobe PDF | View/Open | |
14_refrences.pdf | 2.3 MB | Adobe PDF | View/Open |
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