Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/226542
Title: Design of built in self test controller using march algorithm for fault diagnosis in embedded memories
Researcher: Ahmed, Mohammed Altaf
Guide(s): Elizabeth, Rani D and Sattar, Syed Abdul
Keywords: Engineering and Technology,Engineering,Engineering Electrical and Electronic
University: GITAM University
Completed Date: 2018
Abstract: None
Pagination: 133 p.
URI: http://hdl.handle.net/10603/226542
Appears in Departments:Department of Electronics and Communication Engineering

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01_title.pdfAttached File494.62 kBAdobe PDFView/Open
02_certificates.pdf371.18 kBAdobe PDFView/Open
03_acknowledgements.pdf361.7 kBAdobe PDFView/Open
04_contents.pdf381.49 kBAdobe PDFView/Open
05_preface.pdf352.46 kBAdobe PDFView/Open
06_list of tables figures.pdf371.31 kBAdobe PDFView/Open
07_chapter 1.pdf572.26 kBAdobe PDFView/Open
08_chapter 2.pdf825.35 kBAdobe PDFView/Open
09_chapter 3.pdf826.09 kBAdobe PDFView/Open
10_chapter 4.pdf1.67 MBAdobe PDFView/Open
11_chapter 5.pdf1.26 MBAdobe PDFView/Open
12_chapter 6.pdf2.39 MBAdobe PDFView/Open
13_chapter 7.pdf332.6 kBAdobe PDFView/Open
14_refrences.pdf2.3 MBAdobe PDFView/Open
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