Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/225969
Title: | Low Power Test Architecture for Fault Detection in SRAMs |
Researcher: | Vikram Singh Takher |
Guide(s): | Rahul Raj Choudhary and Sushila |
Keywords: | Engineering and Technology,Engineering,Engineering Electrical and Electronic |
University: | Vivekananda Global University |
Completed Date: | 2019 |
Abstract: | newline |
Pagination: | |
URI: | http://hdl.handle.net/10603/225969 |
Appears in Departments: | Department of Electronics and Communication |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
certificate.pdf | Attached File | 423.44 kB | Adobe PDF | View/Open |
chapter 1.pdf | 223.69 kB | Adobe PDF | View/Open | |
chapter 2.pdf | 332.89 kB | Adobe PDF | View/Open | |
chapter 3.pdf | 363.49 kB | Adobe PDF | View/Open | |
chapter 4.pdf | 336.02 kB | Adobe PDF | View/Open | |
chapter 5.pdf | 380.15 kB | Adobe PDF | View/Open | |
chapter 6.pdf | 103.24 kB | Adobe PDF | View/Open | |
preliminary pages.pdf | 1.72 MB | Adobe PDF | View/Open | |
publication.pdf | 203.57 kB | Adobe PDF | View/Open | |
references.pdf | 148.08 kB | Adobe PDF | View/Open | |
title.pdf | 250.15 kB | Adobe PDF | View/Open |
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