Design and analysis of multiple bit Upsets mitigation techniques for Sram based fpgas

Abstract

The Static Random Access Memories SRAMs are mainly used newlineby reconfigurable devices such as FieldProgrammable Gate Arrays FPGAs newlineand recent programmable System on Chips SoCsRecently the usages of newlineSRAMs have increased and occupied more than 90 of chip area in the newlinemodern FPGA based SoCs These SRAM based FPGAs SFPGAs are newlinedisturbed by radiation induced soft errors and affect system reliability and newlinesustainability Reduced transistor size and increased memory density due to newlinetechnology scaling are increasingly susceptible to MultipleBit Upsets newlineMBUs The largest MBU size observed in the neutroninduced experiment newlineis 24 bits For smaller nanometer technologies, this count is even higher This newlinestatus evidently shows the significance of protecting SFPGAs against MBU newlineincidents In order to validate the reliability of SFPGAs MBU injection and newlineMBU mitigation techniques are proposed in this research work newline newline