Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/22084
Title: | Characterization of latice imperfections in nanocrystalline materials by position annihilation, xray diffraction and other methods |
Researcher: | Abhijit Banerjee |
Guide(s): | Pradhan, Swapan Kr |
Keywords: | Physics |
Upload Date: | 4-Aug-2014 |
University: | The University of Burdwan |
Completed Date: | n.d. |
Abstract: | None |
Pagination: | - |
URI: | http://hdl.handle.net/10603/22084 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
abhijit banerjee, ph.d. thesis.pdf | Attached File | 4.5 MB | Adobe PDF | View/Open |
abhijit banerjee, synopsis.pdf | 428.37 kB | Adobe PDF | View/Open |
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