Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/22084
Title: Characterization of latice imperfections in nanocrystalline materials by position annihilation, xray diffraction and other methods
Researcher: Abhijit Banerjee
Guide(s): Pradhan, Swapan Kr
Keywords: Physics
Upload Date: 4-Aug-2014
University: The University of Burdwan
Completed Date: n.d.
Abstract: None
Pagination: -
URI: http://hdl.handle.net/10603/22084
Appears in Departments:Department of Physics

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abhijit banerjee, ph.d. thesis.pdfAttached File4.5 MBAdobe PDFView/Open
abhijit banerjee, synopsis.pdf428.37 kBAdobe PDFView/Open
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