Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/216366
Title: | Some studies on the effect of information asymmetry phenomenon on product quality engineering and its management |
Researcher: | N, Wankhade Lalit |
Guide(s): | Dabade, B M |
Keywords: | Asymmetry Modellingtool Phenomenon TQM |
University: | Swami Ramanand Teerth Marathwada University |
Completed Date: | 2007 |
Abstract: | Abstract available |
Pagination: | xiv, 156p. |
URI: | http://hdl.handle.net/10603/216366 |
Appears in Departments: | Department of Mechanical and Production Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 24.28 kB | Adobe PDF | View/Open |
02_certificate.pdf | 28.3 kB | Adobe PDF | View/Open | |
03_resume.pdf | 79.03 kB | Adobe PDF | View/Open | |
04_acknowledgement.pdf | 40.84 kB | Adobe PDF | View/Open | |
05_abstract.pdf | 55.47 kB | Adobe PDF | View/Open | |
06_content.pdf | 132.62 kB | Adobe PDF | View/Open | |
07_list of figures.pdf | 62.18 kB | Adobe PDF | View/Open | |
08_list of table.pdf | 34.98 kB | Adobe PDF | View/Open | |
09_chapter 1.pdf | 429.59 kB | Adobe PDF | View/Open | |
10_chapter 2.pdf | 1.34 MB | Adobe PDF | View/Open | |
11_chapter 3.pdf | 601.07 kB | Adobe PDF | View/Open | |
12_chapter 4.pdf | 420.88 kB | Adobe PDF | View/Open | |
13_chapter 5.pdf | 1.47 MB | Adobe PDF | View/Open | |
14_chapter 6.pdf | 974.67 kB | Adobe PDF | View/Open | |
15_chapter 7.pdf | 397.19 kB | Adobe PDF | View/Open | |
16_chapter 8.pdf | 428.9 kB | Adobe PDF | View/Open | |
17_references.pdf | 581.37 kB | Adobe PDF | View/Open | |
18_appendix 1.pdf | 193.43 kB | Adobe PDF | View/Open | |
19_appendix 2.pdf | 98.25 kB | Adobe PDF | View/Open | |
20_appendix 3.pdf | 106.91 kB | Adobe PDF | View/Open | |
21_appendix 4.pdf | 59.59 kB | Adobe PDF | View/Open | |
22_appendix 5.pdf | 133.17 kB | Adobe PDF | View/Open |
Items in Shodhganga are licensed under Creative Commons Licence Attribution-NonCommercial-ShareAlike 4.0 International (CC BY-NC-SA 4.0).
Altmetric Badge: