1. Shodhganga@INFLIBNET
  2. University of Kalyani
  3. Computer Science and Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/211075
Title: Search strategies to solve certain problems of VLSI system design and testing
Researcher: Roy, Samir
Guide(s): Maulik, U; Bandyopadhyay, S; Chakraborty, S
Keywords: BIST
Elitism
Mutation
Pseudo-Random
VLSI
University: University of Kalyani
Completed Date: 2002
Abstract: Abstract available
Pagination: xiv, 159p.
URI: http://hdl.handle.net/10603/211075
Appears in Departments:Computer Science and Engineering

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01_title page.pdfAttached File17.17 kBAdobe PDFView/Open
02_certificate.pdf32.15 kBAdobe PDFView/Open
03_dedication.pdf3.02 kBAdobe PDFView/Open
04_table of content.pdf167.6 kBAdobe PDFView/Open
05_acknowledgement.pdf44.65 kBAdobe PDFView/Open
06_abstract.pdf54.92 kBAdobe PDFView/Open
07_list of figures.pdf45.19 kBAdobe PDFView/Open
08_list of table.pdf60.29 kBAdobe PDFView/Open
09_chapter 1.pdf294.78 kBAdobe PDFView/Open
10_chapter 2.pdf534.12 kBAdobe PDFView/Open
11_chapter 3.pdf892.66 kBAdobe PDFView/Open
12_chapter 4.pdf1.14 MBAdobe PDFView/Open
13_chapter 5.pdf535.02 kBAdobe PDFView/Open
14_chapter 6.pdf972.48 kBAdobe PDFView/Open
15_chapter 7.pdf869.16 kBAdobe PDFView/Open
16_chapter 8.pdf1.08 MBAdobe PDFView/Open
17_chapter 9.pdf101.05 kBAdobe PDFView/Open
18_bibliography.pdf870.12 kBAdobe PDFView/Open
19_list of publications by the author.pdf84.95 kBAdobe PDFView/Open
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