Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/210390
Title: | Deposition Characterization and theoretical analysis of industrially important In2o3 and TiO2 Thin films |
Researcher: | Joseph Panneerdoss I. |
Guide(s): | Johnson Jeyakumar S. |
University: | Bharathidasan University |
Completed Date: | 2014 |
Abstract: | newline |
Pagination: | 258 |
URI: | http://hdl.handle.net/10603/210390 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01 front page.pdf | Attached File | 217.06 kB | Adobe PDF | View/Open |
02 certificate.pdf | 236.98 kB | Adobe PDF | View/Open | |
03 declaration.pdf | 183.19 kB | Adobe PDF | View/Open | |
04 aknowledgement.pdf | 254.95 kB | Adobe PDF | View/Open | |
05 contents.pdf | 386.77 kB | Adobe PDF | View/Open | |
06 chapter i.pdf | 1.04 MB | Adobe PDF | View/Open | |
07 chapter ii.pdf | 367.24 kB | Adobe PDF | View/Open | |
08 chapter iii.pdf | 2.54 MB | Adobe PDF | View/Open | |
09 chapter iv.pdf | 4.07 MB | Adobe PDF | View/Open | |
10 chapter v.pdf | 3.9 MB | Adobe PDF | View/Open | |
11 chapter vi.pdf | 204.79 kB | Adobe PDF | View/Open | |
12 references.pdf | 10.4 MB | Adobe PDF | View/Open |
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