Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/210390
Title: Deposition Characterization and theoretical analysis of industrially important In2o3 and TiO2 Thin films
Researcher: Joseph Panneerdoss I.
Guide(s): Johnson Jeyakumar S.
University: Bharathidasan University
Completed Date: 2014
Abstract: newline
Pagination: 258
URI: http://hdl.handle.net/10603/210390
Appears in Departments:Department of Physics

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01 front page.pdfAttached File217.06 kBAdobe PDFView/Open
02 certificate.pdf236.98 kBAdobe PDFView/Open
03 declaration.pdf183.19 kBAdobe PDFView/Open
04 aknowledgement.pdf254.95 kBAdobe PDFView/Open
05 contents.pdf386.77 kBAdobe PDFView/Open
06 chapter i.pdf1.04 MBAdobe PDFView/Open
07 chapter ii.pdf367.24 kBAdobe PDFView/Open
08 chapter iii.pdf2.54 MBAdobe PDFView/Open
09 chapter iv.pdf4.07 MBAdobe PDFView/Open
10 chapter v.pdf3.9 MBAdobe PDFView/Open
11 chapter vi.pdf204.79 kBAdobe PDFView/Open
12 references.pdf10.4 MBAdobe PDFView/Open
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