1. Shodhganga@INFLIBNET
  2. Jadavpur University
  3. Department of Electronics and Tele-Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/207749
Title: Reliability analysis of advanced nano MOS devices for analog and RF applications
Researcher: Dutta, Arka
Guide(s): Sarkar, Chandan Kumar and Saha, Samar K.
Keywords: Metal Oxide Semiconductors (MOS)
RF applications
Semiconductor devices
University: Jadavpur University
Completed Date: 2015
Abstract: None newline
Pagination: xiv, 186 p.
URI: http://hdl.handle.net/10603/207749
Appears in Departments:Department of Electronics and Tele-Communication Engineering

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01_title.pdfAttached File208.74 kBAdobe PDFView/Open
02_university submission form.pdf308.55 kBAdobe PDFView/Open
03_list of publications.pdf522.61 kBAdobe PDFView/Open
04_certificate.pdf679.05 kBAdobe PDFView/Open
05_dedication.pdf205.23 kBAdobe PDFView/Open
06_acknowledgements.pdf327.92 kBAdobe PDFView/Open
07_abstract.pdf305.88 kBAdobe PDFView/Open
08_contents.pdf511.46 kBAdobe PDFView/Open
09_chapter 1.pdf1.32 MBAdobe PDFView/Open
10_chapter 2.pdf1.89 MBAdobe PDFView/Open
11_chapter 3.pdf1.98 MBAdobe PDFView/Open
12_chapter 4.pdf2.25 MBAdobe PDFView/Open
13_chapter 5.pdf4.2 MBAdobe PDFView/Open
14_chapter 6.pdf1.93 MBAdobe PDFView/Open
15_chapter 7.pdf423.63 kBAdobe PDFView/Open
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