Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/207749
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dc.coverage.spatial
dc.date.accessioned2018-07-12T11:59:59Z-
dc.date.available2018-07-12T11:59:59Z-
dc.identifier.urihttp://hdl.handle.net/10603/207749-
dc.description.abstractNone newline
dc.format.extentxiv, 186 p.
dc.languageEnglish
dc.relation
dc.rightsuniversity
dc.titleReliability analysis of advanced nano MOS devices for analog and RF applications
dc.title.alternative
dc.creator.researcherDutta, Arka
dc.subject.keywordMetal Oxide Semiconductors (MOS)
dc.subject.keywordRF applications
dc.subject.keywordSemiconductor devices
dc.description.noteReferences p. 181-182
dc.contributor.guideSarkar, Chandan Kumar and Saha, Samar K.
dc.publisher.placeKolkata
dc.publisher.universityJadavpur University
dc.publisher.institutionDepartment of Electronics and Tele-Communication Engineering
dc.date.registeredn.d.
dc.date.completed2015
dc.date.awarded2016
dc.format.dimensions
dc.format.accompanyingmaterialNone
dc.source.universityUniversity
dc.type.degreePh.D.
Appears in Departments:Department of Electronics and Tele-Communication Engineering

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01_title.pdfAttached File208.74 kBAdobe PDFView/Open
02_university submission form.pdf308.55 kBAdobe PDFView/Open
03_list of publications.pdf522.61 kBAdobe PDFView/Open
04_certificate.pdf679.05 kBAdobe PDFView/Open
05_dedication.pdf205.23 kBAdobe PDFView/Open
06_acknowledgements.pdf327.92 kBAdobe PDFView/Open
07_abstract.pdf305.88 kBAdobe PDFView/Open
08_contents.pdf511.46 kBAdobe PDFView/Open
09_chapter 1.pdf1.32 MBAdobe PDFView/Open
10_chapter 2.pdf1.89 MBAdobe PDFView/Open
11_chapter 3.pdf1.98 MBAdobe PDFView/Open
12_chapter 4.pdf2.25 MBAdobe PDFView/Open
13_chapter 5.pdf4.2 MBAdobe PDFView/Open
14_chapter 6.pdf1.93 MBAdobe PDFView/Open
15_chapter 7.pdf423.63 kBAdobe PDFView/Open


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