Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/207749
Title: | Reliability analysis of advanced nano MOS devices for analog and RF applications |
Researcher: | Dutta, Arka |
Guide(s): | Sarkar, Chandan Kumar and Saha, Samar K. |
Keywords: | Metal Oxide Semiconductors (MOS) RF applications Semiconductor devices |
University: | Jadavpur University |
Completed Date: | 2015 |
Abstract: | None newline |
Pagination: | xiv, 186 p. |
URI: | http://hdl.handle.net/10603/207749 |
Appears in Departments: | Department of Electronics and Tele-Communication Engineering |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 208.74 kB | Adobe PDF | View/Open |
02_university submission form.pdf | 308.55 kB | Adobe PDF | View/Open | |
03_list of publications.pdf | 522.61 kB | Adobe PDF | View/Open | |
04_certificate.pdf | 679.05 kB | Adobe PDF | View/Open | |
05_dedication.pdf | 205.23 kB | Adobe PDF | View/Open | |
06_acknowledgements.pdf | 327.92 kB | Adobe PDF | View/Open | |
07_abstract.pdf | 305.88 kB | Adobe PDF | View/Open | |
08_contents.pdf | 511.46 kB | Adobe PDF | View/Open | |
09_chapter 1.pdf | 1.32 MB | Adobe PDF | View/Open | |
10_chapter 2.pdf | 1.89 MB | Adobe PDF | View/Open | |
11_chapter 3.pdf | 1.98 MB | Adobe PDF | View/Open | |
12_chapter 4.pdf | 2.25 MB | Adobe PDF | View/Open | |
13_chapter 5.pdf | 4.2 MB | Adobe PDF | View/Open | |
14_chapter 6.pdf | 1.93 MB | Adobe PDF | View/Open | |
15_chapter 7.pdf | 423.63 kB | Adobe PDF | View/Open |
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