Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/20728
Title: | Studies on preparation and characterization of mgf2 and yf5 multilayer antireflection thin films |
Researcher: | Atchaiah Naidu V |
Guide(s): | Kistaiah P |
Keywords: | antireflection thin film |
Upload Date: | 11-Jul-2014 |
University: | Osmania University |
Completed Date: | 20/01/2014 |
Abstract: | newline |
Pagination: | 178p |
URI: | http://hdl.handle.net/10603/20728 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 186.51 kB | Adobe PDF | View/Open |
02_declaration.pdf | 70.51 kB | Adobe PDF | View/Open | |
03_certificate.pdf | 75.35 kB | Adobe PDF | View/Open | |
04_acknowledgements.pdf | 145.5 kB | Adobe PDF | View/Open | |
05_preface.pdf | 663.45 kB | Adobe PDF | View/Open | |
06_contents.pdf | 373.46 kB | Adobe PDF | View/Open | |
07_chapter_1.pdf | 5.7 MB | Adobe PDF | View/Open | |
08_chapter_2.pdf | 4.29 MB | Adobe PDF | View/Open | |
09_chapter_3.pdf | 5.03 MB | Adobe PDF | View/Open | |
10_chapter_4.pdf | 23.89 MB | Adobe PDF | View/Open | |
11_chapter_5.pdf | 2.62 MB | Adobe PDF | View/Open |
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