1. Shodhganga@INFLIBNET
  2. Anna University
  3. Faculty of Information and Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/196227
Title: Analysis of low power high fault coverage testing for sequential circuits
Researcher: M, Thoulath Begam V
Guide(s): Baulkani, S
Keywords: Benchmarks
Circuit
ISCAS
Simulation
Utilization
University: Anna University
Completed Date: 2016
Abstract: Abstract available
Pagination: xvi, 111p.
URI: http://hdl.handle.net/10603/196227
Appears in Departments:Faculty of Information and Communication Engineering

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01_title page.pdfAttached File23.69 kBAdobe PDFView/Open
02_certificate.pdf646.26 kBAdobe PDFView/Open
03_abstract.pdf80.51 kBAdobe PDFView/Open
04_acknowledgement.pdf4.73 kBAdobe PDFView/Open
05_table of content.pdf13.55 kBAdobe PDFView/Open
06_list of table.pdf9.54 kBAdobe PDFView/Open
07_list of figures.pdf10.67 kBAdobe PDFView/Open
08_list of abbreviation.pdf8.4 kBAdobe PDFView/Open
09_chapter 1.pdf645.42 kBAdobe PDFView/Open
10_chapter 2.pdf567.05 kBAdobe PDFView/Open
11_chapter 3.pdf1.18 MBAdobe PDFView/Open
12_chapter 4.pdf563.31 kBAdobe PDFView/Open
13_chapter 5.pdf698.75 kBAdobe PDFView/Open
14_chapter 6.pdf1.13 MBAdobe PDFView/Open
15_chapter 7.pdf107.57 kBAdobe PDFView/Open
16_references.pdf700.28 kBAdobe PDFView/Open
17_list of publication.pdf88.74 kBAdobe PDFView/Open
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