Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/196227
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DC FieldValueLanguage
dc.coverage.spatialInformation and Communication Engineering-
dc.date.accessioned2018-03-15T12:16:34Z-
dc.date.available2018-03-15T12:16:34Z-
dc.identifier.urihttp://hdl.handle.net/10603/196227-
dc.description.abstractAbstract available-
dc.format.extentxvi, 111p.-
dc.languageEnglish-
dc.relation103-110-
dc.rightsuniversity-
dc.titleAnalysis of low power high fault coverage testing for sequential circuits-
dc.creator.researcherM, Thoulath Begam V-
dc.subject.keywordBenchmarks-
dc.subject.keywordCircuit-
dc.subject.keywordISCAS-
dc.subject.keywordSimulation-
dc.subject.keywordUtilization-
dc.description.noteData not available-
dc.contributor.guideBaulkani, S-
dc.publisher.placeChennai-
dc.publisher.universityAnna University-
dc.publisher.institutionFaculty of Information and Communication Engineering-
dc.date.registeredn.d.-
dc.date.completed2016-
dc.date.awardedn.d.-
dc.format.dimensions8cm.-
dc.format.accompanyingmaterialNone-
dc.source.universityUniversity-
dc.type.degreePh.D.-
Appears in Departments:Faculty of Information and Communication Engineering

Files in This Item:
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01_title page.pdfAttached File23.69 kBAdobe PDFView/Open
02_certificate.pdf646.26 kBAdobe PDFView/Open
03_abstract.pdf80.51 kBAdobe PDFView/Open
04_acknowledgement.pdf4.73 kBAdobe PDFView/Open
05_table of content.pdf13.55 kBAdobe PDFView/Open
06_list of table.pdf9.54 kBAdobe PDFView/Open
07_list of figures.pdf10.67 kBAdobe PDFView/Open
08_list of abbreviation.pdf8.4 kBAdobe PDFView/Open
09_chapter 1.pdf645.42 kBAdobe PDFView/Open
10_chapter 2.pdf567.05 kBAdobe PDFView/Open
11_chapter 3.pdf1.18 MBAdobe PDFView/Open
12_chapter 4.pdf563.31 kBAdobe PDFView/Open
13_chapter 5.pdf698.75 kBAdobe PDFView/Open
14_chapter 6.pdf1.13 MBAdobe PDFView/Open
15_chapter 7.pdf107.57 kBAdobe PDFView/Open
16_references.pdf700.28 kBAdobe PDFView/Open
17_list of publication.pdf88.74 kBAdobe PDFView/Open


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