1. Shodhganga@INFLIBNET
  2. Anna University
  3. Faculty of Information and Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/196211
Title: Certain design and analysis techniques for testing VLSI circuits
Researcher: S, Vimalraj
Guide(s): R, Maheswar
Keywords: Dimensional
Sequential
Simulation
Syndrome
Wallace
University: Anna University
Completed Date: 2016
Abstract: Abstract available
Pagination: xxiv, 231p.
URI: http://hdl.handle.net/10603/196211
Appears in Departments:Faculty of Information and Communication Engineering

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01_title page.pdfAttached File26.57 kBAdobe PDFView/Open
02_certificate.pdf191.66 kBAdobe PDFView/Open
03_abstract.pdf58.96 kBAdobe PDFView/Open
04_acknowledgement.pdf16.27 kBAdobe PDFView/Open
05_table of content.pdf424.09 kBAdobe PDFView/Open
06_list of table.pdf74.39 kBAdobe PDFView/Open
07_list of figures.pdf203.5 kBAdobe PDFView/Open
08_list of abbreviation.pdf21.7 kBAdobe PDFView/Open
09_chapter 1.pdf1.01 MBAdobe PDFView/Open
10_chapter 2.pdf1.44 MBAdobe PDFView/Open
11_chapter 3.pdf1.47 MBAdobe PDFView/Open
12_chapter 4.pdf790.82 kBAdobe PDFView/Open
13_chapter 5.pdf1.69 MBAdobe PDFView/Open
14_chapter 6.pdf1.27 MBAdobe PDFView/Open
15_chapter 7.pdf197.6 kBAdobe PDFView/Open
16_appendix 1.pdf208 kBAdobe PDFView/Open
17_appendix 2.pdf133.82 kBAdobe PDFView/Open
18_appendix 3.pdf605.77 kBAdobe PDFView/Open
19_references.pdf868.93 kBAdobe PDFView/Open
20_list of publication.pdf13.98 kBAdobe PDFView/Open
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