1. Shodhganga@INFLIBNET
  2. Anna University
  3. Faculty of Information and Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/195784
Title: Analysis of single event upset in CNTFET sram cell with the development of detection circuitry
Researcher: R, Rajalakshmi T
Guide(s): Sudhakar, R
Keywords: Bridging
Dissipation
Radiation
Resistive
Sensor
University: Anna University
Completed Date: 2017
Abstract: Abstract available
Pagination: xxxii, 119p.
URI: http://hdl.handle.net/10603/195784
Appears in Departments:Faculty of Information and Communication Engineering

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File Description SizeFormat 
01_title page.pdfAttached File46.32 kBAdobe PDFView/Open
02_certificate.pdf1.23 MBAdobe PDFView/Open
03_abstract.pdf549.3 kBAdobe PDFView/Open
04_acknowledgement.pdf81.98 kBAdobe PDFView/Open
05_table of content.pdf465.6 kBAdobe PDFView/Open
06_list of table.pdf278.86 kBAdobe PDFView/Open
07_list of figures.pdf511.5 kBAdobe PDFView/Open
08_list of symbol and abbreviations.pdf429.19 kBAdobe PDFView/Open
09_chapter 1.pdf723.25 kBAdobe PDFView/Open
10_chapter 2.pdf4.85 MBAdobe PDFView/Open
11_chapter 3.pdf7.52 MBAdobe PDFView/Open
12_chapter 4.pdf2.03 MBAdobe PDFView/Open
13_chapter 5.pdf2.08 MBAdobe PDFView/Open
14_chapter 6.pdf1.46 MBAdobe PDFView/Open
15_chapter 7.pdf497.45 kBAdobe PDFView/Open
16_references.pdf783.53 kBAdobe PDFView/Open
17_list of publication.pdf144.42 kBAdobe PDFView/Open
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