1. Shodhganga@INFLIBNET
  2. Jawaharlal Nehru Technological University, Hyderabad
  3. Department of Electronics and Communication Engineering
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/191878
Title: Design of built in self test and repair scheme for static random access memory
Researcher: Asha rani M
Guide(s): Jinaga B C
University: Jawaharlal Nehru Technological University, Hyderabad
Completed Date: 2007
Abstract: newline
URI: http://hdl.handle.net/10603/191878
Appears in Departments:Department of Electronics and Communication Engineering

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01_title.pdfAttached File32.87 kBAdobe PDFView/Open
02_certificate.pdf23.31 kBAdobe PDFView/Open
03_acknowledgement.pdf35.13 kBAdobe PDFView/Open
04_abstract.pdf38.58 kBAdobe PDFView/Open
05_contents.pdf229.78 kBAdobe PDFView/Open
06_chapter_01.pdf401.51 kBAdobe PDFView/Open
07_chapter_02.pdf496.82 kBAdobe PDFView/Open
08_chapter_03.pdf466.6 kBAdobe PDFView/Open
09_chapter_04.pdf569.26 kBAdobe PDFView/Open
10_chapter_05.pdf666.1 kBAdobe PDFView/Open
11_chapter_06.pdf662.85 kBAdobe PDFView/Open
12_chapter_07.pdf883.74 kBAdobe PDFView/Open
13_chapter_08.pdf324.4 kBAdobe PDFView/Open
14_appendix.pdf148.27 kBAdobe PDFView/Open
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