Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/180775
Title: Hierarchical evolution of digital arithmetic circuits with built in self test logic for delay faults
Researcher: Kolanchinathan, V. P.
Guide(s): Kumar, Saravana G. ; Ramesh, G. P. and Velayudham, A.
Keywords: arithmetic
faults
Hierarchical
University: St. Peters University
Completed Date: 2017
Abstract: Available Abstract
Pagination: n.d.
URI: http://hdl.handle.net/10603/180775
Appears in Departments:Department of Electronics and Communication

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01_title.pdfAttached File143.45 kBAdobe PDFView/Open
02_certificate.pdf184.78 kBAdobe PDFView/Open
03_declaration.pdf128.83 kBAdobe PDFView/Open
04_acknowledgement.pdf141.85 kBAdobe PDFView/Open
05_abstract.pdf142.05 kBAdobe PDFView/Open
06_contents.pdf180.32 kBAdobe PDFView/Open
07_chapter 1.pdf592.89 kBAdobe PDFView/Open
08_chapter 2.pdf334.46 kBAdobe PDFView/Open
09_chapter 3.pdf1.16 MBAdobe PDFView/Open
10_chapter 4.pdf408.24 kBAdobe PDFView/Open
11_chapter 5.pdf669.16 kBAdobe PDFView/Open
12_chapter 6.pdf1.68 MBAdobe PDFView/Open
13_chapter 7.pdf240.56 kBAdobe PDFView/Open
14_chapter 8.pdf101.63 kBAdobe PDFView/Open
15_references.pdf219.27 kBAdobe PDFView/Open
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