Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/180775
Title: | Hierarchical evolution of digital arithmetic circuits with built in self test logic for delay faults |
Researcher: | Kolanchinathan, V. P. |
Guide(s): | Kumar, Saravana G. ; Ramesh, G. P. and Velayudham, A. |
Keywords: | arithmetic faults Hierarchical |
University: | St. Peters University |
Completed Date: | 2017 |
Abstract: | Available Abstract |
Pagination: | n.d. |
URI: | http://hdl.handle.net/10603/180775 |
Appears in Departments: | Department of Electronics and Communication |
Files in This Item:
File | Description | Size | Format | |
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01_title.pdf | Attached File | 143.45 kB | Adobe PDF | View/Open |
02_certificate.pdf | 184.78 kB | Adobe PDF | View/Open | |
03_declaration.pdf | 128.83 kB | Adobe PDF | View/Open | |
04_acknowledgement.pdf | 141.85 kB | Adobe PDF | View/Open | |
05_abstract.pdf | 142.05 kB | Adobe PDF | View/Open | |
06_contents.pdf | 180.32 kB | Adobe PDF | View/Open | |
07_chapter 1.pdf | 592.89 kB | Adobe PDF | View/Open | |
08_chapter 2.pdf | 334.46 kB | Adobe PDF | View/Open | |
09_chapter 3.pdf | 1.16 MB | Adobe PDF | View/Open | |
10_chapter 4.pdf | 408.24 kB | Adobe PDF | View/Open | |
11_chapter 5.pdf | 669.16 kB | Adobe PDF | View/Open | |
12_chapter 6.pdf | 1.68 MB | Adobe PDF | View/Open | |
13_chapter 7.pdf | 240.56 kB | Adobe PDF | View/Open | |
14_chapter 8.pdf | 101.63 kB | Adobe PDF | View/Open | |
15_references.pdf | 219.27 kB | Adobe PDF | View/Open |
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