Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/175569
Title: Fabrication and characterization of nanocrystalline porous silicon and porous silicon based optoelectronic devices
Researcher: Kulathuraan K
Guide(s): Natarajan B
Keywords: higher roughness
occurs around
Porous silicon
University: Manonmaniam Sundaranar University
Completed Date: 2016
Abstract: The structural optical and electrical features newline
Pagination: xxvii, 176
URI: http://hdl.handle.net/10603/175569
Appears in Departments:Department of Physics

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01_title.pdfAttached File51.68 kBAdobe PDFView/Open
02_certificate.pdf19.42 kBAdobe PDFView/Open
03_declaration.pdf17.73 kBAdobe PDFView/Open
04_acknowledgment.pdf155.64 kBAdobe PDFView/Open
05_contents.pdf20.91 kBAdobe PDFView/Open
06_list of figures & tables.pdf93.41 kBAdobe PDFView/Open
07_list of abbreviation.pdf22.92 kBAdobe PDFView/Open
08_preface.pdf25.57 kBAdobe PDFView/Open
09_chapter1.pdf565.93 kBAdobe PDFView/Open
10_chapter2.pdf1.07 MBAdobe PDFView/Open
11_chapter3.pdf2.35 MBAdobe PDFView/Open
12_chapter4.pdf1.55 MBAdobe PDFView/Open
13_chapter5.pdf1.26 MBAdobe PDFView/Open
14_chapter6.pdf526.31 kBAdobe PDFView/Open
15_chapter7.pdf29.16 kBAdobe PDFView/Open
16_reference.pdf98.56 kBAdobe PDFView/Open
17_list of publication.pdf3.88 MBAdobe PDFView/Open
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