Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/172070
Title: On the design of easily testable logic networks for detection of stuck at and bridging faults
Researcher: Gupta, Bidyut
Guide(s): Choudhury, A K
Keywords: Detection
Faults
Logic
Networks
Testable
University: University of Calcutta
Completed Date: 1984
Abstract: Abstract not available
Pagination: vi, 161p.
URI: http://hdl.handle.net/10603/172070
Appears in Departments:Department of Computer Science

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01_title page.pdfAttached File19.83 kBAdobe PDFView/Open
02_acknowledgement.pdf24.01 kBAdobe PDFView/Open
03_content.pdf124.02 kBAdobe PDFView/Open
04_chapter 1.pdf298.45 kBAdobe PDFView/Open
05_chapter 2.pdf1.06 MBAdobe PDFView/Open
06_chapter 3.pdf1.18 MBAdobe PDFView/Open
07_chapter 4.pdf1.07 MBAdobe PDFView/Open
08_chapter 5.pdf845.14 kBAdobe PDFView/Open
09_chapter 6.pdf1.26 MBAdobe PDFView/Open
10_chapter 7.pdf769.52 kBAdobe PDFView/Open
11_conclusion.pdf106.27 kBAdobe PDFView/Open
12_bibliography.pdf577.2 kBAdobe PDFView/Open
13_list of publication.pdf90.85 kBAdobe PDFView/Open
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