Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/136447
Title: Analysis of average and local structure and charcterization of important metals and semiconductor materials using single crystal and powder x ray diffraction
Researcher: Prema Rani, M
Guide(s): Saravanan, R
Keywords: Crystal
Metallurgy
Metals
Semiconductors
University: Madurai Kamraj University
Completed Date: n.d.
Abstract: None newline
Pagination: 333 p.
URI: http://hdl.handle.net/10603/136447
Appears in Departments:Department of Physics

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01_title.pdfAttached File150.21 kBAdobe PDFView/Open
02_declaration.pdf62.31 kBAdobe PDFView/Open
03_certificate.pdf155.06 kBAdobe PDFView/Open
04_acknowledgement.pdf322.13 kBAdobe PDFView/Open
05_contents.pdf247.57 kBAdobe PDFView/Open
06_preface.pdf320.25 kBAdobe PDFView/Open
07_list of tables figures.pdf1.31 MBAdobe PDFView/Open
08_chapter 1.pdf1.68 MBAdobe PDFView/Open
09_chapter 2.pdf1.69 MBAdobe PDFView/Open
10_chapter 3.pdf11.88 MBAdobe PDFView/Open
11_chapter 5.pdf640.76 kBAdobe PDFView/Open
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