Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/136447
Title: | Analysis of average and local structure and charcterization of important metals and semiconductor materials using single crystal and powder x ray diffraction |
Researcher: | Prema Rani, M |
Guide(s): | Saravanan, R |
Keywords: | Crystal Metallurgy Metals Semiconductors |
University: | Madurai Kamraj University |
Completed Date: | n.d. |
Abstract: | None newline |
Pagination: | 333 p. |
URI: | http://hdl.handle.net/10603/136447 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
01_title.pdf | Attached File | 150.21 kB | Adobe PDF | View/Open |
02_declaration.pdf | 62.31 kB | Adobe PDF | View/Open | |
03_certificate.pdf | 155.06 kB | Adobe PDF | View/Open | |
04_acknowledgement.pdf | 322.13 kB | Adobe PDF | View/Open | |
05_contents.pdf | 247.57 kB | Adobe PDF | View/Open | |
06_preface.pdf | 320.25 kB | Adobe PDF | View/Open | |
07_list of tables figures.pdf | 1.31 MB | Adobe PDF | View/Open | |
08_chapter 1.pdf | 1.68 MB | Adobe PDF | View/Open | |
09_chapter 2.pdf | 1.69 MB | Adobe PDF | View/Open | |
10_chapter 3.pdf | 11.88 MB | Adobe PDF | View/Open | |
11_chapter 5.pdf | 640.76 kB | Adobe PDF | View/Open |
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