Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/134383
Title: | X_ray photoelectron spectroscopic studies and property measurements on electroless nickel and copper deposits |
Researcher: | Nageswararao, N B S |
Guide(s): | Jog, R H |
Keywords: | Deposition techniques, Substrates, Ellipsometry, SEM studies, Reflectance spectroscopy |
University: | Savitribai Phule Pune University |
Completed Date: | 1984 |
Abstract: | Abstract not available newline |
Pagination: | ii, 172p. |
URI: | http://hdl.handle.net/10603/134383 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
/01_title.pdf | Attached File | 23.3 kB | Adobe PDF | View/Open |
01_title.pdf | 23.3 kB | Adobe PDF | View/Open | |
/02_certificate.pdf | 24.81 kB | Adobe PDF | View/Open | |
02_certificate.pdf | 24.81 kB | Adobe PDF | View/Open | |
03_acknowledgement.pdf | 49.84 kB | Adobe PDF | View/Open | |
04_contents.pdf | 46.66 kB | Adobe PDF | View/Open | |
05_chapter i.pdf | 1.98 MB | Adobe PDF | View/Open | |
06_chapter ii.pdf | 900.43 kB | Adobe PDF | View/Open | |
07_chapter iii.pdf | 3.21 MB | Adobe PDF | View/Open | |
08_summary.pdf | 293.22 kB | Adobe PDF | View/Open | |
09_references.pdf | 584.54 kB | Adobe PDF | View/Open |
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