Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/134383
Title: X_ray photoelectron spectroscopic studies and property measurements on electroless nickel and copper deposits
Researcher: Nageswararao, N B S
Guide(s): Jog, R H
Keywords: Deposition techniques, Substrates, Ellipsometry, SEM studies, Reflectance spectroscopy
University: Savitribai Phule Pune University
Completed Date: 1984
Abstract: Abstract not available newline
Pagination: ii, 172p.
URI: http://hdl.handle.net/10603/134383
Appears in Departments:Department of Physics

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01_title.pdf23.3 kBAdobe PDFView/Open
/02_certificate.pdf24.81 kBAdobe PDFView/Open
02_certificate.pdf24.81 kBAdobe PDFView/Open
03_acknowledgement.pdf49.84 kBAdobe PDFView/Open
04_contents.pdf46.66 kBAdobe PDFView/Open
05_chapter i.pdf1.98 MBAdobe PDFView/Open
06_chapter ii.pdf900.43 kBAdobe PDFView/Open
07_chapter iii.pdf3.21 MBAdobe PDFView/Open
08_summary.pdf293.22 kBAdobe PDFView/Open
09_references.pdf584.54 kBAdobe PDFView/Open
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