1. Shodhganga@INFLIBNET
  2. Savitribai Phule Pune University
  3. Department of Electronic Science
Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/134346
Title: Improvement of quality and reliability of electronic circuits at design stage using Taguchi method
Researcher: Walunj, A K
Guide(s): Shaligram, A D
Keywords: Circuit reliability, Taguchi method, Anova, Bjt degradation, Robust circuit design
University: Savitribai Phule Pune University
Completed Date: 2007
Abstract: Abstract not available newline newline
Pagination: viii, 209p.
URI: http://hdl.handle.net/10603/134346
Appears in Departments:Department of Electronic Science

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/01_title.pdfAttached File787.92 kBAdobe PDFView/Open
01_title.pdf787.92 kBAdobe PDFView/Open
/02_certificate.pdf256.9 kBAdobe PDFView/Open
02_certificate.pdf256.9 kBAdobe PDFView/Open
/03_declaration.pdf789.44 kBAdobe PDFView/Open
03_declaration.pdf789.44 kBAdobe PDFView/Open
/04_acknowledgement.pdf114.09 kBAdobe PDFView/Open
04_acknowledgement.pdf114.09 kBAdobe PDFView/Open
05_list of publications.pdf68.72 kBAdobe PDFView/Open
/06_contents.pdf97.21 kBAdobe PDFView/Open
06_contents.pdf97.21 kBAdobe PDFView/Open
07_list of symbols.pdf65.66 kBAdobe PDFView/Open
08_list of figures.pdf85.58 kBAdobe PDFView/Open
09_list of tables.pdf46.14 kBAdobe PDFView/Open
10_chapter 1.pdf1.02 MBAdobe PDFView/Open
11_chapter 2.pdf6.39 MBAdobe PDFView/Open
12_chapter 3.pdf1.46 MBAdobe PDFView/Open
13_chapter 4.pdf3.52 MBAdobe PDFView/Open
14_chapter 5.pdf9.36 MBAdobe PDFView/Open
15_chapter 6.pdf336.1 kBAdobe PDFView/Open
16_appendix.pdf6.67 MBAdobe PDFView/Open
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