Please use this identifier to cite or link to this item: http://hdl.handle.net/10603/134341
Title: Design development commissioning of time_of_flight atom probe and its use in microanalysis of metallic glass
Researcher: More, Mahendra A
Guide(s): Joag, Dilip S
Keywords: Atom probes, Image hump model, Field ion microscope, Operation of fim, Metallic bonding
University: Savitribai Phule Pune University
Completed Date: 1994
Abstract: Abstract not available newline
Pagination: 81p.
URI: http://hdl.handle.net/10603/134341
Appears in Departments:Department of Physics

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01_title.pdf24.28 kBAdobe PDFView/Open
/02_certificate.pdf24.51 kBAdobe PDFView/Open
02_certificate.pdf24.51 kBAdobe PDFView/Open
03_contents.pdf95.45 kBAdobe PDFView/Open
04_chapter 1.pdf878.38 kBAdobe PDFView/Open
05_chapter 2.pdf848.47 kBAdobe PDFView/Open
06_chapter 3.pdf713.07 kBAdobe PDFView/Open
07_chapter 4.pdf1.42 MBAdobe PDFView/Open
08_chapter 5.pdf1.17 MBAdobe PDFView/Open
09_chapter 6.pdf348.46 kBAdobe PDFView/Open
10_summary.pdf68.4 kBAdobe PDFView/Open
11_appendix.pdf2.24 MBAdobe PDFView/Open
12_acknowledgement.pdf316.12 kBAdobe PDFView/Open
13_publications.pdf32.9 kBAdobe PDFView/Open
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