Please use this identifier to cite or link to this item:
http://hdl.handle.net/10603/134341
Title: | Design development commissioning of time_of_flight atom probe and its use in microanalysis of metallic glass |
Researcher: | More, Mahendra A |
Guide(s): | Joag, Dilip S |
Keywords: | Atom probes, Image hump model, Field ion microscope, Operation of fim, Metallic bonding |
University: | Savitribai Phule Pune University |
Completed Date: | 1994 |
Abstract: | Abstract not available newline |
Pagination: | 81p. |
URI: | http://hdl.handle.net/10603/134341 |
Appears in Departments: | Department of Physics |
Files in This Item:
File | Description | Size | Format | |
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/01_title.pdf | Attached File | 24.28 kB | Adobe PDF | View/Open |
01_title.pdf | 24.28 kB | Adobe PDF | View/Open | |
/02_certificate.pdf | 24.51 kB | Adobe PDF | View/Open | |
02_certificate.pdf | 24.51 kB | Adobe PDF | View/Open | |
03_contents.pdf | 95.45 kB | Adobe PDF | View/Open | |
04_chapter 1.pdf | 878.38 kB | Adobe PDF | View/Open | |
05_chapter 2.pdf | 848.47 kB | Adobe PDF | View/Open | |
06_chapter 3.pdf | 713.07 kB | Adobe PDF | View/Open | |
07_chapter 4.pdf | 1.42 MB | Adobe PDF | View/Open | |
08_chapter 5.pdf | 1.17 MB | Adobe PDF | View/Open | |
09_chapter 6.pdf | 348.46 kB | Adobe PDF | View/Open | |
10_summary.pdf | 68.4 kB | Adobe PDF | View/Open | |
11_appendix.pdf | 2.24 MB | Adobe PDF | View/Open | |
12_acknowledgement.pdf | 316.12 kB | Adobe PDF | View/Open | |
13_publications.pdf | 32.9 kB | Adobe PDF | View/Open |
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